Mircea R. Stan: Circadian Rhythms for Future Resilient Electronic Systems
Circadian Rhythms for Future Resilient Electronic Systems
Buch
- Accelerated Active Self-Healing for Integrated Circuits
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EUR 153,32**
EUR 109,51*
- Springer International Publishing AG, 06/2019
- Einband: Gebunden, HC runder Rücken kaschiert
- Sprache: Englisch
- ISBN-13: 9783030200503
- Bestellnummer: 9365682
- Umfang: 228 Seiten
- Nummer der Auflage: 19001
- Auflage: 1st ed. 2020
- Gewicht: 512 g
- Maße: 235 x 155 mm
- Stärke: 18 mm
- Erscheinungstermin: 24.6.2019
Achtung: Artikel ist nicht in deutscher Sprache!
Weitere Ausgaben von Circadian Rhythms for Future Resilient Electronic Systems
Klappentext
This book describes methods to address wearout / aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models.Presents novel techniques, tested with experiments on real hardware;
Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;
Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;
Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;
Includes coverage of resilient aspects of emerging applications such as IoT.